The highly anticipated Rohde & Schwarz Power Electronics Online Conference is officially scheduled to take place on May 5 and 6, 2026. Titled “From Design to Validation,” this free, comprehensive virtual event will bring together some of the brightest minds from both industry and academia. For hardware developers, test engineers, and the B2B tech community following AarokaTech.com, this conference represents a critical opportunity to explore reliable measurement and validation methods for the next generation of modern power electronic systems—spanning from discrete semiconductor components to massive grid-connected converters.
As the global electronics market rapidly evolves, power design engineers face unprecedented challenges. The industry is currently being driven by stricter energy efficiency targets, demands for significantly higher power densities, and increasing integration with large-scale renewable power grids. Consequently, engineers must effectively manage non-ideal component behavior, mitigate fast transient stresses on wide-bandgap (WBG) devices, and navigate increasingly stringent Electromagnetic Compatibility (EMC) requirements.
This upcoming Rohde & Schwarz Power Electronics Online Conference aims to address these exact pain points by presenting practical, measurement-centric solutions that can be seamlessly implemented using modern oscilloscopes, vector network analyzers, and precision power analyzers.
Headline Keynotes: Shaping the Future of Power Grids
The two-day program is anchored by high-profile keynote addresses from leading semiconductor manufacturers.
The event kicks off on May 5 with a powerful keynote by Tobias Keller of Hitachi Energy, titled “Power Semiconductors: Shaping the Future Power Grid – Performance and Reliability for Future Decades.” During this session, Keller will dive deep into the rigorous qualification processes required for both traditional silicon and advanced silicon carbide (SiC) devices intended for high-voltage grid applications. Attendees can expect detailed discussions surrounding thermal cycling, short-circuit robustness, and the critical importance of long-term reliability data.
On May 6, Veit Hellwig from Infineon Technologies will deliver the second keynote. His presentation will pivot to the revolutionary impact of gallium-nitride (GaN) technology, specifically examining its transformative role in high-voltage motor inverter topologies.
Deep-Dive Technical Sessions and Workshops
Beyond the visionary keynotes, the conference will feature a robust series of highly technical, hands-on sessions designed to solve immediate engineering bottlenecks:
- Passive Component Characterization: One standout presentation will analyze the intricacies of passive component testing. It will highlight innovative methods for extracting parasitic inductance and capacitance at extreme frequencies above 100 MHz, demonstrating exactly how these non-idealities severely influence converter stability.
- SiC and GaN Dynamic Characterization: Another vital session will detail the automated dynamic characterization of SiC and GaN power devices. Experts will show how complex double-pulse test rigs can be perfectly synchronized with high-speed digitizers. This approach not only drastically reduces measurement uncertainty but also accurately captures the incredibly fast recovery behavior inherent to wide-bandgap semiconductors.
Conquering Electromagnetic Compatibility (EMC)
Electromagnetic compatibility remains one of the most common stumbling blocks in product development. To address this, the conference includes two dedicated talks on EMC:
- Near-Field Probing: The first session offers practical, step-by-step guidance on utilizing near-field probes to pinpoint elusive radiated emission sources and validate the real-world effectiveness of custom EMI filter designs.
- Conducted Emission Workflows: The second talk will demonstrate a complete, end-to-end conducted emission measurement workflow on a small-scale prototype. Utilizing a Line Impedance Stabilization Network (LISN) paired with a modern mixed-signal oscilloscope, the presenter will outline a unique filter design methodology that fully exploits the time-frequency capabilities of the testing instrument.
Addressing the AI Server Power Crisis
As artificial intelligence continues to reshape the tech landscape, the demand for high-density computing is surging. A dedicated webinar during the event will address the explosive need for highly accurate efficiency measurements in data center and AI server power supplies.
By employing precision power analyzers capable of seamlessly tracking highly distorted waveforms and managing rapid load transients, participants will learn the exact methodologies needed to obtain true input and output power values. This is essential knowledge for engineers striving to satisfy strict 80 PLUS certification requirements.
Ensuring Grid Compliance and Flicker Standards
The final session of the event will focus heavily on harmonic current and voltage flicker compliance for low-voltage, grid-connected products. The featured speaker will comprehensively review the limits and exact test procedures defined in vital international standards, including IEC/EN 61000-3-2/-3-3 and IEC/EN 61000-3-12/-3-11. Furthermore, the session will demonstrate how integrated compliance testing software, when linked to a high-end power analyzer, can deliver automated pass/fail decisions—streamlining the journey from early prototype evaluation all the way to final type approval.
Registration and Speaker Lineup
The speaker roster features an impressive lineup of subject matter experts from Rohde & Schwarz, Hitachi, Infineon, PE-Systems, Würth Elektronik, alongside academic leaders from the Universities of Bremen and Zaragoza. Their diverse contributions perfectly combine deep academic insight with rugged industrial experience.
While the Rohde & Schwarz Power Electronics Online Conference is completely free of charge, prior registration is strictly required to access the streams. B2B professionals, engineers, and researchers can view the full agenda, read speaker biographies, and secure their spot by visiting the official registration portal at the Rohde & Schwarz website.
