As the demands of artificial intelligence (AI) workloads push network infrastructures to their absolute limits, the reliability of high-speed optical and copper interconnects has never been more critical. Meeting this industry-wide challenge, Keysight Technologies has officially introduced its Functional Interconnect Test Solutions (FITS) portfolio, debuting with its flagship product: the FITS-8CH.
At AarokaTech, we continually track the testing and measurement innovations that make next-generation networking possible. The FITS-8CH is designed to deliver comprehensive digital-layer bit error ratio (BER) and forward error correction (FEC) performance validation. This enables manufacturers of network equipment, chips, and interconnects to guarantee component reliability before reaching mass production and deployment in AI data centers.
Bridging the Gap in System-Level Error Performance
As interconnect speeds scale to support 400GE, 800GE, and 1.6T Ethernet architectures, designs are growing exponentially more complex. Traditional physical-layer testing establishes a necessary compliance baseline, but it often falls short of predicting how fully integrated interconnects will behave under real-world operational stress.
To accurately assess system conditions, every electrical and optical lane must undergo high-speed error-performance validation. Skipping this step increases the risk of catastrophic field failures and costly production delays.
The FITS-8CH bridges this gap by offering multiple-lane error performance validation at the digital layer. Moving beyond standard physical-layer measurements, it supports rigorous error performance assessments for high-speed PAM4 electrical lanes operating at 53 Gb/s, 106 Gb/s, and 212 Gb/s.
Key Features of the FITS-8CH Analyzer
Built for manufacturing readiness and high-scale reliability, the FITS-8CH chassis seamlessly integrates with Keysight’s existing physical layer test solutions. Key benefits of the new system include:
- Multiple-Lane BER and FEC Validation: The system performs simultaneous, bi-directional real-time testing across all eight transmit and eight receive channels. By validating BER and FEC at the system level, engineering teams can test complete copper and optical assemblies rather than relying on isolated measurements.
- Flexible Channel Architecture: The analyzer utilizes two complementary channel groups—high-drive outputs and chip-to-module (C2M) interfaces. This architecture allows teams to test a vast array of active cables, electrical fixtures, and silicon topologies without the need to redesign test setups or sacrifice signal fidelity.
- High-Quality Signal Generation: Compliant with IEEE P802.3dj standards, the FITS-8CH provides exceptionally clean transmit signals. This ensures that measured error performance reflects the true behavior of the interconnect, rather than anomalies introduced by the testing environment itself.
- Automated Lane Tuning: To improve measurement repeatability, the system automatically adjusts transmit tap settings lane-by-lane, optimizing PAM4 signal output and opening the electrical eye for maximum clarity.
- Early Detection of Manufacturing Defects: Whether used in R&D or end-of-line manufacturing, the analyzer quickly identifies thermal failures, mechanical misalignments, and incorrect digital signal processor (DSP) tap settings, preventing defective products from ever reaching the customer.
Industry Impact: Securing 1.6T Reliability for Mass Production
Industry partners are already leveraging the FITS portfolio to secure their production lines. Kenji Liao, High-Speed Interconnect PM Director at UDE Corporation, highlighted the operational advantages of the new system.
“With FITS-8CH, Keysight provides the digital-layer error performance analysis we need to verify 1.6T AEC BER-per-lane requirements under realistic operating conditions,” said Liao. “The ability to characterize lane-level error behavior across complete interconnect assemblies helps us identify margin issues earlier and maintain consistency as we transition designs into volume production.”
Ram Periakaruppan, Vice President and General Manager of Network Test & Security Solutions at Keysight, emphasized the broader strategic vision behind the launch. “As validation requirements move up the stack from the physical layer, our customers increasingly need solutions that scale across development, manufacturing, and deployment,” Periakaruppan stated. “This is the first offering in our FITS portfolio, a new series of solutions designed to support error performance validation across the entire product lifecycle.”
See Keysight at OFC 2026
Engineers and network architects looking to experience this technology firsthand can visit Keysight Technologies next week at the Optical Fiber Communication (OFC) Conference. Keysight will be showcasing the FITS-8CH and other advanced network validation solutions in the South Hall at Booth #1300 from March 17-19, 2026, at the Los Angeles Convention Center.
